BibSLEIGH — Janak_H

Travelled to:

3 × France
9 × USA

Collaborated with:

E.M.Rudnick P.Banerjee W.K.Fuchs T.M.Niermann A.R.Pandey V.Chickermane J.Lee U.J.Davé S.J.Chandra S.J.Patel M.Malkawi S.Venkataraman M.S.Hsiao S.Parkes S.Patil W.Cheng P.Mazumder D.Xiang G.S.Greenstein J.G.Holm D.G.Saab S.Kim I.Hartanto S.Chakravarty

Talks about:

test (12) generat (11) sequenti (9) circuit (9) algorithm (5) design (4) parallel (3) approach (3) memori (3) genet (3)

Person: Janak H. Patel

DBLP: Patel:Janak_H=

Contributed to:

2002

1997

1996

1995

1994

1993

1992

1991

1990

1989

1987

1986

1985

Wrote 18 papers:

DATE-2002-PandeyP #algorithm #architecture #design #generative #incremental #testing: An Incremental Algorithm for Test Generation in Illinois Scan Architecture Based Designs (ARP, JHP), pp. 368–375.
EDTC-1997-HsiaoRP #generative #testing #traversal #using: Sequential circuit test generation using dynamic state traversal (MSH, EMR, JHP), pp. 22–28.
DAC-1996-XiangVFP #design: Partial Scan Design Based on Circuit State Information (DX, SV, WKF, JHP), pp. 807–812.
DAC-1995-RudnickP #generative #search-based #testing: Combining Deterministic and Genetic Approaches for Sequential Circuit Test Generation (EMR, JHP), pp. 183–188.
DAC-1995-VenkataramanHFRCP #agile #fault #simulation #using: Rapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact Lists (SV, IH, WKF, EMR, SC, JHP), pp. 133–138.
DAC-1994-ParkesBP #approach #generative #named #object-oriented #parallel #testing: ProperHITEC: A Portable, Parallel, Object-Oriented Approach to Sequential Test Generation (SP, PB, JHP), pp. 717–721.
DAC-1994-RudnickPGN #algorithm #framework #generative #search-based #testing: Sequential Circuit Test Generation in a Genetic Algorithm Framework (EMR, JHP, GSG, TMN), pp. 698–704.
EDAC-1994-RudnickHSP #algorithm #generative #search-based #testing: Application of Simple Genetic Algorithms to Sequential Circuit Test Generation (EMR, JGH, DGS, JHP), pp. 40–45.
DAC-1993-ChickermaneRBP: Non-Scan Design-for-Testability Techniques for Sequential Circuits (VC, EMR, PB, JHP), pp. 236–241.
DAC-1992-KimBCP #algorithm #named: APT: An Area-Performance-Testability Driven Placement Algorithm (SK, PB, VC, JHP), pp. 141–146.
DAC-1992-LeeP #constraints #functional #generative #testing: Hierarchical Test Generation under Intensive Global Functional Constraints (JL, JHP), pp. 261–266.
DAC-1991-PatilBP #generative #parallel #testing: Parallel Test Generation for Sequential Circuits on General-Purpose Multiprocessors (SP, PB, JHP), pp. 155–159.
DAC-1990-NiermannCP #fault #memory management #named #performance #proving: Proofs: A Fast, Memory Efficient Sequential Circuit Fault Simulator (TMN, WTC, JHP), pp. 535–540.
DAC-1989-DaveP #generative #testing #using: A Functional-Level Test Generation Methodology Using Two-level Representations (UJD, JHP), pp. 722–725.
DAC-1987-ChandraP #approach #generative: A Hierarchical Approach Test Vector Generation (SJC, JHP), pp. 495–501.
DAC-1987-MazumderPF #algorithm #design #parallel #random #testing: Design and Algorithms for Parallel Testing of Random Access and Content Addressable Memories (PM, JHP, WKF), pp. 689–694.
DAC-1986-PatelP #automation #effectiveness #generative #heuristic #metric: Effectiveness of heuristics measures for automatic test pattern generation (SJP, JHP), pp. 547–552.
SOSP-1985-MalkawiP #compilation #memory management #policy #source code: Compiler Directed Memory Management Policy For Numerical Programs (MM, JHP), pp. 97–106.