Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits
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Oriol Roig, Jordi Cortadella, Marco A. Peña, Enric Pastor
Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits
DAC, 1997.

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@inproceedings{DAC-1997-RoigCPP,
	author        = "Oriol Roig and Jordi Cortadella and Marco A. Peña and Enric Pastor",
	booktitle     = "{Proceedings of the 34th Design Automation Conference}",
	doi           = "10.1145/266021.266300",
	isbn          = "0-89791-920-3",
	pages         = "620--625",
	publisher     = "{ACM Press}",
	title         = "{Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits}",
	year          = 1997,
}

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