Irith Pomeranz
Random Limited-Scan to Improve Random Pattern Testing of Scan Circuits
DAC, 2001.
@inproceedings{DAC-2001-Pomeranz,
author = "Irith Pomeranz",
booktitle = "{Proceedings of the 38th Design Automation Conference}",
doi = "10.1145/378239.378385",
isbn = "1-58113-297-2",
pages = "145--150",
publisher = "{ACM}",
title = "{Random Limited-Scan to Improve Random Pattern Testing of Scan Circuits}",
year = 2001,
}











