Irith Pomeranz
Random Limited-Scan to Improve Random Pattern Testing of Scan Circuits
DAC, 2001.
@inproceedings{DAC-2001-Pomeranz, author = "Irith Pomeranz", booktitle = "{Proceedings of the 38th Design Automation Conference}", doi = "10.1145/378239.378385", isbn = "1-58113-297-2", pages = "145--150", publisher = "{ACM}", title = "{Random Limited-Scan to Improve Random Pattern Testing of Scan Circuits}", year = 2001, }