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Travelled to:
18 × USA
8 × Germany
9 × France
Collaborated with:
S.M.Reddy J.Rajski S.Kundu R.Guo W.Li Y.Zorian K.Cheng G.Chen C.Liu X.Lin P.Uppaluri A.Kumar B.Becker S.Remersaro S.Venkataraman B.Seshadri C.Yu S.Kajihara K.Kinoshita H.Tang C.Wang
Talks about:
test (45) fault (34) generat (19) circuit (19) scan (13) base (12) use (11) sequenti (9) detect (9) set (9)

Person: Irith Pomeranz

DBLP DBLP: Pomeranz:Irith

Contributed to:

DAC 20152015
DATE 20142014
DATE 20132013
DAC 20112011
DATE 20112011
DATE 20102010
DATE 20092009
DAC 20082008
DATE 20082008
DATE 20072007
DAC 20062006
DATE 20062006
DAC 20052005
DATE 20052005
DAC 20042004
DATE v1 20042004
DAC 20032003
DATE 20032003
DAC 20022002
DATE 20022002
DAC 20012001
DATE 20012001
DAC 20002000
DATE 20002000
DAC 19991999
DATE 19991999
DATE 19981998
DAC 19971997
ED&TC 19971997
DAC 19961996
DAC 19951995
DAC 19941994
DAC 19931993
DAC 19921992
DAC 19911991

Wrote 62 papers:

DAC-2015-Pomeranz #generative #testing
Generation of close-to-functional broadside tests with equal primary input vectors (IP), p. 6.
DATE-2014-Pomeranz #generative #testing
Test and non-test cubes for diagnostic test generation based on merging of test cubes (IP), pp. 1–4.
DATE-2014-Pomeranz14a #fault
Substituting transition faults with path delay faults as a basic delay fault model (IP), pp. 1–6.
DATE-2013-Pomeranz #equivalence #fault #graph #on the #set
On candidate fault sets for fault diagnosis and dominance graphs of equivalence classes (IP), pp. 1083–1088.
DAC-2011-Pomeranz #clustering #fault
Diagnosis of transition fault clusters (IP), pp. 429–434.
DATE-2011-KumarRPB #3d #clustering #testing
Hyper-graph based partitioning to reduce DFT cost for pre-bond 3D-IC testing (AK, SMR, IP, BB), pp. 1424–1429.
DATE-2011-Pomeranz #functional #generative #testing
Built-in generation of functional broadside tests (IP), pp. 1297–1302.
DATE-2010-PomeranzR #requirements #sequence #testing #using
Reducing the storage requirements of a test sequence by using a background vector (IP, SMR), pp. 1237–1242.
DATE-2010-PomeranzR10a #functional #on the #testing
On reset based functional broadside tests (IP, SMR), pp. 1438–1443.
DATE-2009-PomeranzR #fault
Selection of a fault model for fault diagnosis based on unique responses (IP, SMR), pp. 994–999.
DATE-2009-RemersaroRRP #generative #scalability #testing
A scalable method for the generation of small test sets (SR, JR, SMR, IP), pp. 1136–1141.
DAC-2008-ReddyPL #detection #on the #testing
On tests to detect via opens in digital CMOS circuits (SMR, IP, CL), pp. 840–845.
DATE-2008-PomeranzR #detection #fault #logic
A Bridging Fault Model Where Undetectable Faults Imply Logic Redundancy (IP, SMR), pp. 1166–1171.
DATE-2008-PomeranzR08a #fault #taxonomy
A Same/Different Fault Dictionary: An Extended Pass/Fail Fault Dictionary with Improved Diagnostic Resolution (IP, SMR), pp. 1474–1479.
DATE-2007-PomeranzR #generative #on the #testing
On test generation by input cube avoidance (IP, SMR), pp. 522–527.
DAC-2006-ChenRPR #algorithm
A test pattern ordering algorithm for diagnosis with truncated fail data (GC, SMR, IP, JR), pp. 399–404.
DATE-2006-PomeranzR #detection #fault #generative #testing
Generation of broadside transition fault test sets that detect four-way bridging faults (IP, SMR), pp. 907–912.
DATE-2006-PomeranzR06a #fault
Test compaction for transition faults under transparent-scan (IP, SMR), pp. 1264–1269.
DAC-2005-Pomeranz #detection
N-detection under transparent-scan (IP), pp. 129–134.
DATE-2005-PomeranzR #analysis #detection #testing #worst-case
Worst-Case and Average-Case Analysis of n-Detection Test Sets (IP, SMR), pp. 444–449.
DATE-2005-PomeranzR05a #detection #fault #heuristic
The Accidental Detection Index as a Fault Ordering Heuristic for Full-Scan Circuits (IP, SMR), pp. 1008–1013.
DATE-2005-TangCRWRP #fault
Defect Aware Test Patterns (HT, GC, SMR, CW, JR, IP), pp. 450–455.
DAC-2004-LiRP #fault #generative #on the #testing
On test generation for transition faults with minimized peak power dissipation (WL, SMR, IP), pp. 504–509.
DAC-2004-Pomeranz #functional #generative #on the #testing
On the generation of scan-based test sets with reachable states for testing under functional operation conditions (IP), pp. 928–933.
DAC-2004-Pomeranz04a
Scan-BIST based on transition probabilities (IP), pp. 940–943.
DATE-v1-2004-PomeranzR #fault #metric #similarity
Level of Similarity: A Metric for Fault Collapsing (IP, SMR), pp. 56–61.
DATE-v1-2004-PomeranzVRS #detection #fault
Z-Sets and Z-Detections: Circuit Characteristics that Simplify Fault Diagnosis (IP, SV, SMR, BS), pp. 68–75.
DAC-2003-LiYRP #generative #markov #using
A scan BIST generation method using a markov source and partial bit-fixing (WL, CY, SMR, IP), pp. 554–559.
DAC-2003-PomeranzR #detection #on the #testing
On test data compression and n-detection test sets (IP, SMR), pp. 748–751.
DATE-2003-PomeranzR #approach #generative #testing
A New Approach to Test Generation and Test Compaction for Scan Circuits (IP, SMR), pp. 11000–11005.
DATE-2003-PomeranzR03a #dependence #testing
Test Data Compression Based on Output Dependence (IP, SMR), pp. 11186–11187.
DATE-2003-PomeranzRK #detection #fault #on the
On the Characterization of Hard-to-Detect Bridging Faults (IP, SMR, SK), pp. 11012–11019.
DAC-2002-PomeranzKR #on the
On output response compression in the presence of unknown output values (IP, SK, SMR), pp. 255–258.
DATE-2002-PomeranzR #fault #multi #set #using
Test Enrichment for Path Delay Faults Using Multiple Sets of Target Faults (IP, SMR), pp. 722–729.
DATE-2002-PomeranzRR #debugging #fault
Finding a Common Fault Response for Diagnosis during Silicon Debug (IP, JR, SMR), p. 1116.
DATE-2002-PomeranzZ #fault #testing #using
Fault Isolation Using Tests for Non-Isolated Blocks (IP, YZ), p. 1123.
DAC-2001-Pomeranz #random #testing
Random Limited-Scan to Improve Random Pattern Testing of Scan Circuits (IP), pp. 145–150.
DAC-2001-PomeranzR #approach #testing
An Approach to Test Compaction for Scan Circuits that Enhances At-Speed Testing (IP, SMR), pp. 156–161.
DATE-2001-PomeranzR #order #sequence
Sequence reordering to improve the levels of compaction achievable by static compaction procedures (IP, SMR), pp. 214–218.
DATE-2001-PomeranzR01a #detection #effectiveness #fault #generative #testing
Definitions of the numbers of detections of target faults and their effectiveness in guiding test generation for high defect coverage (IP, SMR), pp. 504–508.
DAC-2000-PomeranzR #fault #on the
On diagnosis of pattern-dependent delay faults (IP, SMR), pp. 59–62.
DATE-2000-PomeranzR #generative #sequence #testing
Built-In Generation of Weighted Test Sequences for Synchronous Sequential Circuits (IP, SMR), pp. 298–304.
DATE-2000-PomeranzR00a #functional #generative #testing
Functional Test Generation for Full Scan Circuits (IP, SMR), pp. 396–401.
DAC-1999-GuoRP #generative #named #using
Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction (RG, SMR, IP), pp. 653–659.
DAC-1999-PomeranzR #generative #sequence #testing
Built-In Test Sequence Generation for Synchronous Sequential Circuits Based on Loading and Expansion of Test Subsequences (IP, SMR), pp. 754–759.
DATE-1999-LinPR #fault
Full Scan Fault Coverage With Partial Scan (XL, IP, SMR), pp. 468–472.
DATE-1998-GuoPR #sequence #testing
Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits Based on Vector Restoration (RG, IP, SMR), pp. 583–587.
DATE-1998-PomeranzR #flexibility #logic #synthesis
A Synthesis Procedure for Flexible Logic Functions (IP, SMR), pp. 973–974.
DATE-1998-PomeranzR98a #using
Design-for-Testability for Synchronous Sequential Circuits using Locally Available Lines (IP, SMR), pp. 983–984.
DAC-1997-PomeranzR #approach #fault #multi #simulation #using
Fault Simulation under the Multiple Observation Time Approach using Backward Implications (IP, SMR), pp. 608–613.
EDTC-1997-PomeranzR #generative #on the #optimisation #search-based #testing
On improving genetic optimization based test generation (IP, SMR), pp. 506–511.
EDTC-1997-PomeranzR97a #finite #on the #state machine #testing
On the use of reset to increase the testability of interconnected finite-state machines (IP, SMR), pp. 554–559.
DAC-1996-PomeranzR #on the #sequence #testing
On Static Compaction of Test Sequences for Synchronous Sequential Circuits (IP, SMR), pp. 215–220.
DAC-1995-PomeranzR #logic #on the
On Synthesis-for-Testability of Combinational Logic Circuits (IP, SMR), pp. 126–132.
DAC-1994-PomeranzR #combinator #fault #scalability #using
Design-for-Testability for Path Delay Faults in Large Combinatorial Circuits Using Test-Points (IP, SMR), pp. 358–364.
DAC-1994-PomeranzR94a #fault #on the
On Improving Fault Diagnosis for Synchronous Sequential Circuits (IP, SMR), pp. 504–509.
DAC-1993-KajiharaPKR #effectiveness #fault #generative #logic #testing
Cost-Effective Generation of Minimal Test Sets for Stuck-at Faults in Combinational Logic Circuits (SK, IP, KK, SMR), pp. 102–106.
DAC-1993-PomeranzR #generative #incremental #learning #named #testing
INCREDYBLE-TG: INCREmental DYnamic test generation based on LEarning (IP, SMR), pp. 80–85.
DAC-1993-PomeranzRU #fault #generative #named #testing
NEST: A Non-Enumerative Test Generation Method for Path Delay Faults in Combinational Circuits (IP, SMR, PU), pp. 439–445.
DAC-1992-PomeranzC #using
State Assignment Using Input/Output Functions (IP, KTC), pp. 573–577.
DAC-1992-PomeranzR #testing
At-Speed Delay Testing of Synchronous Sequential Circuits (IP, SMR), pp. 177–181.
DAC-1991-PomeranzR #fault #on the #using
On Achieving a Complete Fault Coverage for Sequential Machines Using the Transition Fault Model (IP, SMR), pp. 341–346.

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