Lin Huang, Feng Yuan, Qiang Xu
On reliable modular testing with vulnerable test access mechanisms
DAC, 2008.
@inproceedings{DAC-2008-HuangYX,
	author        = "Lin Huang and Feng Yuan and Qiang Xu",
	booktitle     = "{Proceedings of the 45th Design Automation Conference}",
	doi           = "10.1145/1391469.1391681",
	isbn          = "978-1-60558-115-6",
	pages         = "834--839",
	publisher     = "{ACM}",
	title         = "{On reliable modular testing with vulnerable test access mechanisms}",
	year          = 2008,
}











