Modeling of failure probability and statistical design of spin-torque transfer magnetic random access memory (STT MRAM) array for yield enhancement
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Jing Li, Charles Augustine, Sayeef S. Salahuddin, Kaushik Roy
Modeling of failure probability and statistical design of spin-torque transfer magnetic random access memory (STT MRAM) array for yield enhancement
DAC, 2008.

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@inproceedings{DAC-2008-LiASR,
	author        = "Jing Li and Charles Augustine and Sayeef S. Salahuddin and Kaushik Roy",
	booktitle     = "{Proceedings of the 45th Design Automation Conference}",
	doi           = "10.1145/1391469.1391540",
	isbn          = "978-1-60558-115-6",
	pages         = "278--283",
	publisher     = "{ACM}",
	title         = "{Modeling of failure probability and statistical design of spin-torque transfer magnetic random access memory (STT MRAM) array for yield enhancement}",
	year          = 2008,
}

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