Ender Yilmaz, Sule Ozev
Adaptive test elimination for analog/RF circuits
DAC, 2009.
@inproceedings{DAC-2009-YilmazO, author = "Ender Yilmaz and Sule Ozev", booktitle = "{Proceedings of the 46th Design Automation Conference}", doi = "10.1145/1629911.1630098", isbn = "978-1-60558-497-3", pages = "720--725", publisher = "{ACM}", title = "{Adaptive test elimination for analog/RF circuits}", year = 2009, }