Alfred V. Gomes, Abhijit Chatterjee
Minimal Length Diagnostic Tests for Analog Circuits using Test History
DATE, 1999.
@inproceedings{DATE-1999-GomesC, author = "Alfred V. Gomes and Abhijit Chatterjee", booktitle = "{Proceedings of the Fourth Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.1999.761120", isbn = "0-7695-0078-1", pages = "189--194", publisher = "{IEEE Computer Society}", title = "{Minimal Length Diagnostic Tests for Analog Circuits using Test History}", year = 1999, }