Alfred V. Gomes, Abhijit Chatterjee
Minimal Length Diagnostic Tests for Analog Circuits using Test History
DATE, 1999.
@inproceedings{DATE-1999-GomesC,
author = "Alfred V. Gomes and Abhijit Chatterjee",
booktitle = "{Proceedings of the Fourth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.1999.761120",
isbn = "0-7695-0078-1",
pages = "189--194",
publisher = "{IEEE Computer Society}",
title = "{Minimal Length Diagnostic Tests for Analog Circuits using Test History}",
year = 1999,
}











