Travelled to:
1 × Germany
Collaborated with:
A.Chatterjee
Talks about:
test (2) diagnost (1) histori (1) circuit (1) length (1) analog (1) minim (1) use (1)
Person: Alfred V. Gomes
DBLP: Gomes:Alfred_V=
Contributed to:
Wrote 1 papers:
- DATE-1999-GomesC #testing #using
- Minimal Length Diagnostic Tests for Analog Circuits using Test History (AVG, AC), pp. 189–194.