Dirk Niggemeyer, M. Rüffer
Parametric Built-In Self-Test of VLSI Systems
DATE, 1999.
@inproceedings{DATE-1999-NiggemeyerR,
author = "Dirk Niggemeyer and M. Rüffer",
booktitle = "{Proceedings of the Fourth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.1999.761149",
isbn = "0-7695-0078-1",
pages = "376--None",
publisher = "{IEEE Computer Society}",
title = "{Parametric Built-In Self-Test of VLSI Systems}",
year = 1999,
}











