Dirk Niggemeyer, M. Rüffer
Parametric Built-In Self-Test of VLSI Systems
DATE, 1999.
@inproceedings{DATE-1999-NiggemeyerR, author = "Dirk Niggemeyer and M. Rüffer", booktitle = "{Proceedings of the Fourth Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.1999.761149", isbn = "0-7695-0078-1", pages = "376--None", publisher = "{IEEE Computer Society}", title = "{Parametric Built-In Self-Test of VLSI Systems}", year = 1999, }