Travelled to:
1 × Germany
Collaborated with:
D.Niggemeyer
Talks about:
parametr (1) system (1) built (1) vlsi (1) test (1) self (1)
Person: M. Rüffer
DBLP: R=uuml=ffer:M=
Contributed to:
Wrote 1 papers:
- DATE-1999-NiggemeyerR #parametricity #self
- Parametric Built-In Self-Test of VLSI Systems (DN, MR), p. 376–?.