@inproceedings{DATE-2001-HashizumeIYT,
	author        = "Masaki Hashizume and Masahiro Ichimiya and Hiroyuki Yotsuyanagi and Takeomi Tamesada",
	booktitle     = "{Proceedings of the Sixth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1145/367072.367358",
	isbn          = "0-7695-0993-2",
	pages         = "509",
	publisher     = "{ACM}",
	title         = "{CMOS open defect detection by supply current test}",
	year          = 2001,
}