Zaid Al-Ars, A. J. van de Goor
Modeling Techniques and Tests for Partial Faults in Memory Devices
DATE, 2002.
@inproceedings{DATE-2002-Al-ArsG,
acmid = "874362",
author = "Zaid Al-Ars and A. J. van de Goor",
booktitle = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2002.998254",
isbn = "0-7695-1471-5",
pages = "89--93",
publisher = "{IEEE Computer Society}",
title = "{Modeling Techniques and Tests for Partial Faults in Memory Devices}",
year = 2002,
}