Jun-Weir Lin, Chung-Len Lee, Jwu E. Chen
An Efficient Test and Diagnosis Scheme for the Feedback Type of Analog Circuits with Minimal Added Circuits
DATE, 2002.
@inproceedings{DATE-2002-LinLC,
acmid = "874490",
author = "Jun-Weir Lin and Chung-Len Lee and Jwu E. Chen",
booktitle = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2002.998475",
isbn = "0-7695-1471-5",
pages = "1119",
publisher = "{IEEE Computer Society}",
title = "{An Efficient Test and Diagnosis Scheme for the Feedback Type of Analog Circuits with Minimal Added Circuits}",
year = 2002,
}