Travelled to:
1 × France
Collaborated with:
C.Lee J.E.Chen
Talks about:
circuit (2) feedback (1) diagnosi (1) scheme (1) effici (1) analog (1) minim (1) type (1) test (1) ad (1)
Person: Jun-Weir Lin
DBLP: Lin:Jun=Weir
Contributed to:
Wrote 1 papers:
- DATE-2002-LinLC #feedback #performance
- An Efficient Test and Diagnosis Scheme for the Feedback Type of Analog Circuits with Minimal Added Circuits (JWL, CLL, JEC), p. 1119.