Jin-Fu Li, Tsu-Wei Tseng, Chin-Long Wey
An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories
DATE, 2005.
@inproceedings{DATE-2005-LiTW, author = "Jin-Fu Li and Tsu-Wei Tseng and Chin-Long Wey", booktitle = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2005.56", isbn = "0-7695-2288-2", pages = "574--579", publisher = "{IEEE Computer Society}", title = "{An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories}", year = 2005, }