Travelled to:1 × France
3 × Germany
Collaborated with:T.Tseng C.Wu D.Chang C.Wey H.Huang J.Chen C.Su C.Cheng S.Chen C.Hwang H.Lin
Talks about:scheme (3) redund (2) memori (2) test (2) transpar (1) hierarch (1) diagnosi (1) compress (1) syndrom (1) analysi (1)
Person: Jin-Fu Li
DBLP: Li:Jin=Fu
Contributed to:
2006200520022001Wrote 4 papers:
- DATE-2006-TsengLC #2d #using
- A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap (TWT, JFL, DMC), pp. 53–58.
- DATE-2005-LiTW #embedded #performance
- An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories (JFL, TWT, CLW), pp. 574–579.
- DATE-2002-LiHCSWCCHL #design
- A Hierarchical Test Scheme for System-On-Chip Designs (JFL, HJH, JBC, CPS, CWW, CC, SIC, CYH, HPL), pp. 486–490.
- DATE-2001-LiW #fault #memory management
- Memory fault diagnosis by syndrome compression (JFL, CWW), pp. 97–101.