Travelled to:2 × Germany
Collaborated with:J.Li D.Chang C.Wey
Talks about:scheme (2) redund (2) transpar (1) analysi (1) orient (1) memori (1) effici (1) bitmap (1) local (1) embed (1)
Person: Tsu-Wei Tseng
DBLP: Tseng:Tsu=Wei
Contributed to:
20062005Wrote 2 papers:
- DATE-2006-TsengLC #2d #using
- A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap (TWT, JFL, DMC), pp. 53–58.
- DATE-2005-LiTW #embedded #performance
- An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories (JFL, TWT, CLW), pp. 574–579.