Osama Neiroukh, Xiaoyu Song
Improving the Process-Variation Tolerance of Digital Circuits Using Gate Sizing and Statistical Techniques
DATE, 2005.
@inproceedings{DATE-2005-NeiroukhS,
author = "Osama Neiroukh and Xiaoyu Song",
booktitle = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2005.180",
isbn = "0-7695-2288-2",
pages = "294--299",
publisher = "{IEEE Computer Society}",
title = "{Improving the Process-Variation Tolerance of Digital Circuits Using Gate Sizing and Statistical Techniques}",
year = 2005,
}