Travelled to:1 × Germany
Collaborated with:X.Song
Talks about:techniqu (1) statist (1) process (1) circuit (1) variat (1) improv (1) toler (1) digit (1) size (1) gate (1)
Person: Osama Neiroukh
DBLP: Neiroukh:Osama
Contributed to:
2005Wrote 1 papers:
- DATE-2005-NeiroukhS #statistics #using
- Improving the Process-Variation Tolerance of Digital Circuits Using Gate Sizing and Statistical Techniques (ON, XS), pp. 294–299.