Sudarshan Bahukudumbi, Krishnendu Chakrabarty, Richard Kacprowicz
Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs
DATE, 2008.
@inproceedings{DATE-2008-BahukudumbiCK,
author = "Sudarshan Bahukudumbi and Krishnendu Chakrabarty and Richard Kacprowicz",
booktitle = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2008.4484925",
isbn = "978-3-9810801-3-1",
pages = "1103--1106",
publisher = "{IEEE}",
title = "{Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs}",
year = 2008,
}
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