Daniela De Venuto, Leonardo Reyneri
PWM-Based Test Stimuli Generation for BIST of High Resolution ADCs
DATE, 2008.
@inproceedings{DATE-2008-VenutoR, author = "Daniela De Venuto and Leonardo Reyneri", booktitle = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2008.4484899", isbn = "978-3-9810801-3-1", pages = "284--287", publisher = "{IEEE}", title = "{PWM-Based Test Stimuli Generation for BIST of High Resolution ADCs}", year = 2008, }