Yu Bi, Kees-Jan van der Kolk, Jorge Fernandez Villena, Luis Miguel Silveira, Nick van der Meijs
Fast statistical analysis of RC nets subject to manufacturing variabilities
DATE, 2011.
@inproceedings{DATE-2011-BiKVSM,
author = "Yu Bi and Kees-Jan van der Kolk and Jorge Fernandez Villena and Luis Miguel Silveira and Nick van der Meijs",
booktitle = "{Proceedings of the 15th Conference on Design, Automation and Test in Europe}",
isbn = "978-1-61284-208-0",
pages = "31--37",
publisher = "{IEEE}",
title = "{Fast statistical analysis of RC nets subject to manufacturing variabilities}",
year = 2011,
}