Mahdi Fazeli, Seyed Nematollah Ahmadian, Seyed Ghassem Miremadi, Hossein Asadi, Mehdi Baradaran Tahoori
Soft error rate estimation of digital circuits in the presence of Multiple Event Transients (METs)
DATE, 2011.
@inproceedings{DATE-2011-FazeliAMAT,
author = "Mahdi Fazeli and Seyed Nematollah Ahmadian and Seyed Ghassem Miremadi and Hossein Asadi and Mehdi Baradaran Tahoori",
booktitle = "{Proceedings of the 15th Conference on Design, Automation and Test in Europe}",
isbn = "978-1-61284-208-0",
pages = "70--75",
publisher = "{IEEE}",
title = "{Soft error rate estimation of digital circuits in the presence of Multiple Event Transients (METs)}",
year = 2011,
}