Naghmeh Karimi, Krishnendu Chakrabarty, Pallav Gupta, Srinivas Patil
Test generation for clock-domain crossing faults in integrated circuits
DATE, 2012.
@inproceedings{DATE-2012-KarimiCGP,
acmid = "2492811",
author = "Naghmeh Karimi and Krishnendu Chakrabarty and Pallav Gupta and Srinivas Patil",
booktitle = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
isbn = "978-1-4577-2145-8",
pages = "406--411",
publisher = "{IEEE}",
title = "{Test generation for clock-domain crossing faults in integrated circuits}",
year = 2012,
}