Hsiu-Yi Lin, Chun-Yao Wang, Shih-Chieh Chang, Yung-Chih Chen, Hsuan-Ming Chou, Ching-Yi Huang, Yen-Chi Yang, Chun-Chien Shen
A probabilistic analysis method for functional qualification under Mutation Analysis
DATE, 2012.
@inproceedings{DATE-2012-LinWCCCHYS,
acmid = "2492744",
author = "Hsiu-Yi Lin and Chun-Yao Wang and Shih-Chieh Chang and Yung-Chih Chen and Hsuan-Ming Chou and Ching-Yi Huang and Yen-Chi Yang and Chun-Chien Shen",
booktitle = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
isbn = "978-1-4577-2145-8",
pages = "147--152",
publisher = "{IEEE}",
title = "{A probabilistic analysis method for functional qualification under Mutation Analysis}",
year = 2012,
}
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