Chang-Chih Chen, Linda Milor
System-level modeling and microprocessor reliability analysis for backend wearout mechanisms
DATE, 2013.
@inproceedings{DATE-2013-ChenM,
acmid = "2485672",
author = "Chang-Chih Chen and Linda Milor",
booktitle = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
isbn = "978-1-4503-2153-2",
pages = "1615--1620",
publisher = "{EDA Consortium San Jose, CA, USA / ACM DL}",
title = "{System-level modeling and microprocessor reliability analysis for backend wearout mechanisms}",
year = 2013,
}