Travelled to:
1 × France
Collaborated with:
L.Milor
Talks about:
microprocessor (1) wearout (1) reliabl (1) backend (1) analysi (1) system (1) mechan (1) model (1) level (1)
Person: Chang-Chih Chen
DBLP: Chen:Chang=Chih
Contributed to:
Wrote 1 papers:
- DATE-2013-ChenM #analysis #modelling #reliability
- System-level modeling and microprocessor reliability analysis for backend wearout mechanisms (CCC, LM), pp. 1615–1620.