Stem wearout$ (all stems)

2 papers:

DAC-2013-TajikHD #3d #architecture #manycore #named #process

VAWOM: temperature and process variation aware wearout management in 3D multicore architecture (HT, HH, ND), p. 8.

DATE-2013-ChenM #analysis #modelling #reliability

System-level modeling and microprocessor reliability analysis for backend wearout mechanisms (CCC, LM), pp. 1615–1620.