Accurate and efficient reliability estimation techniques during ADL-driven embedded processor design
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Zheng Wang, Kapil Singh, Chao Chen, Anupam Chattopadhyay
Accurate and efficient reliability estimation techniques during ADL-driven embedded processor design
DATE, 2013.

DATE 2013
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@inproceedings{DATE-2013-WangSCC,
	acmid         = "2485423",
	author        = "Zheng Wang and Kapil Singh and Chao Chen and Anupam Chattopadhyay",
	booktitle     = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
	isbn          = "978-1-4503-2153-2",
	pages         = "547--552",
	publisher     = "{EDA Consortium San Jose, CA, USA / ACM DL}",
	title         = "{Accurate and efficient reliability estimation techniques during ADL-driven embedded processor design}",
	year          = 2013,
}

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