Physics-based electromigration modeling and assessment for multi-segment interconnects in power grid networks
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Xiaoyi Wang, Hongyu Wang, Jian He, Sheldon X.-D. Tan, Yici Cai, Shengqi Yang
Physics-based electromigration modeling and assessment for multi-segment interconnects in power grid networks
DATE, 2017.

DATE 2017
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@inproceedings{DATE-2017-WangWHTCY,
	author        = "Xiaoyi Wang and Hongyu Wang and Jian He and Sheldon X.-D. Tan and Yici Cai and Shengqi Yang",
	booktitle     = "{Proceedings of the 21st Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2017.7927272",
	isbn          = "978-3-9815370-8-6",
	pages         = "1727--1732",
	publisher     = "{IEEE}",
	title         = "{Physics-based electromigration modeling and assessment for multi-segment interconnects in power grid networks}",
	year          = 2017,
}


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