Hadi Ahmadi Balef, Kees Goossens, José Pineda de Gyvez
Chip Health Tracking Using Dynamic In-Situ Delay Monitoring
DATE, 2019.
@inproceedings{DATE-2019-BalefGG,
author = "Hadi Ahmadi Balef and Kees Goossens and José Pineda de Gyvez",
booktitle = "{Proceedings of the 23rd Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2019.8715014",
isbn = "978-3-9819263-2-3",
pages = "304--307",
publisher = "{IEEE}",
title = "{Chip Health Tracking Using Dynamic In-Situ Delay Monitoring}",
year = 2019,
}