@inproceedings{EDTC-1997-BlantonH,
	author        = "Ronald D. Blanton and John P. Hayes",
	booktitle     = "{Proceedings of the Second European Design and Test Conference}",
	doi           = "10.1109/EDTC.1997.582441",
	pages         = "628",
	publisher     = "{IEEE}",
	title         = "{The input pattern fault model and its application}",
	year          = 1997,
}