Travelled to:1 × France
1 × Germany
3 × USA
Collaborated with:K.N.Dwarakanath J.P.Hayes O.Poku R.Arunachalam L.T.Pileggi J.G.Brown B.Taylor L.T.Pileggi Y.Lin N.K.Bhatti H.Wang X.Yu S.Liu I.Komara
Talks about:fault (3) pattern (2) test (2) interact (1) diagnosi (1) univers (1) testabl (1) librari (1) analysi (1) static (1)
Person: Ronald D. Blanton
DBLP: Blanton:Ronald_D=
Contributed to:
2012
2008200120001997Wrote 6 papers:
- DAC-2012-WangPYLKB #optimisation #testing
- Test-data volume optimization for diagnosis (HW, OP, XY, SL, IK, RDB), pp. 567–572.
- DATE-2008-BrownTBP #automation #library #logic #testing
- Automated Testability Enhancements for Logic Brick Libraries (JGB, BT, RDB, LTP), pp. 480–485.
- DATE-2008-LinPBB #detection
- Physically-Aware N-Detect Test Pattern Selection (YTL, OP, NKB, RDB), pp. 634–639.
- DAC-2001-ArunachalamBP #analysis #interactive
- False Coupling Interactions in Static Timing Analysis (RA, RDB, LTP), pp. 726–731.
- DAC-2000-DwarakanathB #fault #simulation #tuple #using
- Universal fault simulation using fault tuples (KND, RDB), pp. 786–789.
- EDTC-1997-BlantonH #fault
- The input pattern fault model and its application (RDB, JPH), p. 628.