Kazuo Iwama, Kensuke Hino, Hiroyuki Kurokawa, Sunao Sawada
Random benchmark circuits with controlled attributes
DATE, 1997.
@inproceedings{EDTC-1997-IwamaHKS,
author = "Kazuo Iwama and Kensuke Hino and Hiroyuki Kurokawa and Sunao Sawada",
booktitle = "{Proceedings of the Second European Design and Test Conference}",
doi = "10.1109/EDTC.1997.582338",
pages = "90--97",
publisher = "{IEEE}",
title = "{Random benchmark circuits with controlled attributes}",
year = 1997,
}