Random benchmark circuits with controlled attributes
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Kazuo Iwama, Kensuke Hino, Hiroyuki Kurokawa, Sunao Sawada
Random benchmark circuits with controlled attributes
DATE, 1997.

EDTC 1997
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@inproceedings{EDTC-1997-IwamaHKS,
	author        = "Kazuo Iwama and Kensuke Hino and Hiroyuki Kurokawa and Sunao Sawada",
	booktitle     = "{Proceedings of the Second European Design and Test Conference}",
	doi           = "10.1109/EDTC.1997.582338",
	pages         = "90--97",
	publisher     = "{IEEE}",
	title         = "{Random benchmark circuits with controlled attributes}",
	year          = 1997,
}

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