Travelled to:
1 × France
Collaborated with:
K.Iwama K.Hino H.Kurokawa
Talks about:
benchmark (1) attribut (1) control (1) circuit (1) random (1)
Person: Sunao Sawada
DBLP: Sawada:Sunao
Contributed to:
Wrote 1 papers:
- EDTC-1997-IwamaHKS #benchmark #metric #random
- Random benchmark circuits with controlled attributes (KI, KH, HK, SS), pp. 90–97.