Foyzur Rahman, Daryl Posnett, Israel Herraiz, Premkumar T. Devanbu
Sample size vs. bias in defect prediction
ESEC-FSE, 2013.
@inproceedings{ESEC-FSE-2013-RahmanPHD,
author = "Foyzur Rahman and Daryl Posnett and Israel Herraiz and Premkumar T. Devanbu",
booktitle = "{Proceedings of the Joint Meeting of the 14th European Software Engineering Conference and the 21th Symposium on the Foundations of Software Engineering}",
doi = "10.1145/2491411.2491418",
editor = "Bertrand Meyer and Luciano Baresi and Mira Mezini",
isbn = "978-1-4503-2237-9",
pages = "147--157",
publisher = "{ACM}",
title = "{Sample size vs. bias in defect prediction}",
year = 2013,
}
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