Johannes Keustermans, Wouter Mollemans, Dirk Vandermeulen, Paul Suetens
Automated Cephalometric Landmark Identification Using Shape and Local Appearance Models
ICPR, 2010.
@inproceedings{ICPR-2010-KeustermansMVS,
author = "Johannes Keustermans and Wouter Mollemans and Dirk Vandermeulen and Paul Suetens",
booktitle = "{Proceedings of the 20th International Conference on Pattern Recognition}",
doi = "10.1109/ICPR.2010.603",
isbn = "978-0-7695-4109-9",
pages = "2464--2467",
publisher = "{IEEE Computer Society}",
title = "{Automated Cephalometric Landmark Identification Using Shape and Local Appearance Models}",
year = 2010,
}











