Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application
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B. Muralikrishnan, K. Najarian, J. Raja
Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application
ICPR, 2002.

ICPR v1 2002
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@inproceedings{ICPR-v1-2002-MuralikrishnanNR,
	author        = "B. Muralikrishnan and K. Najarian and J. Raja",
	booktitle     = "{Proceedings of the 16th International Conference on Pattern Recognition, Volume 1}",
	doi           = "10.1109/ICPR.2002.1044581",
	isbn          = "0-7695-1695-5",
	pages         = "29--32",
	publisher     = "{IEEE Computer Society}",
	title         = "{Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application}",
	year          = 2002,
}

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