B. Muralikrishnan, K. Najarian, J. Raja
Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application
ICPR, 2002.
@inproceedings{ICPR-v1-2002-MuralikrishnanNR, author = "B. Muralikrishnan and K. Najarian and J. Raja", booktitle = "{Proceedings of the 16th International Conference on Pattern Recognition, Volume 1}", doi = "10.1109/ICPR.2002.1044581", isbn = "0-7695-1695-5", pages = "29--32", publisher = "{IEEE Computer Society}", title = "{Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application}", year = 2002, }