Shin-Min Chao, Du-Ming Tsai, Yan-Hsin Tseng, Yuan-Ruei Jhang
Defect detection in low-contrast glass substrates using anisotropic diffusion
ICPR, 2006.
@inproceedings{ICPR-v1-2006-ChaoTTJ,
author = "Shin-Min Chao and Du-Ming Tsai and Yan-Hsin Tseng and Yuan-Ruei Jhang",
booktitle = "{Proceedings of the 18th International Conference on Pattern Recognition, Volume 1}",
doi = "10.1109/ICPR.2006.427",
isbn = "0-7695-2521-0",
pages = "654--657",
publisher = "{IEEE Computer Society}",
title = "{Defect detection in low-contrast glass substrates using anisotropic diffusion}",
year = 2006,
}











