Defect detection in low-contrast glass substrates using anisotropic diffusion
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Shin-Min Chao, Du-Ming Tsai, Yan-Hsin Tseng, Yuan-Ruei Jhang
Defect detection in low-contrast glass substrates using anisotropic diffusion
ICPR, 2006.

ICPR v1 2006
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@inproceedings{ICPR-v1-2006-ChaoTTJ,
	author        = "Shin-Min Chao and Du-Ming Tsai and Yan-Hsin Tseng and Yuan-Ruei Jhang",
	booktitle     = "{Proceedings of the 18th International Conference on Pattern Recognition, Volume 1}",
	doi           = "10.1109/ICPR.2006.427",
	isbn          = "0-7695-2521-0",
	pages         = "654--657",
	publisher     = "{IEEE Computer Society}",
	title         = "{Defect detection in low-contrast glass substrates using anisotropic diffusion}",
	year          = 2006,
}

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