Shin-Min Chao, Du-Ming Tsai, Yan-Hsin Tseng, Yuan-Ruei Jhang
Defect detection in low-contrast glass substrates using anisotropic diffusion
ICPR, 2006.
@inproceedings{ICPR-v1-2006-ChaoTTJ, author = "Shin-Min Chao and Du-Ming Tsai and Yan-Hsin Tseng and Yuan-Ruei Jhang", booktitle = "{Proceedings of the 18th International Conference on Pattern Recognition, Volume 1}", doi = "10.1109/ICPR.2006.427", isbn = "0-7695-2521-0", pages = "654--657", publisher = "{IEEE Computer Society}", title = "{Defect detection in low-contrast glass substrates using anisotropic diffusion}", year = 2006, }