Amos Y. Johnson, Aaron F. Bobick
Relationship between Identification Metrics: Expected Confusion and Area Under a ROC Curve
ICPR, 2002.
@inproceedings{ICPR-v3-2002-JohnsonB, author = "Amos Y. Johnson and Aaron F. Bobick", booktitle = "{Proceedings of the 16th International Conference on Pattern Recognition, Volume 3}", doi = "10.1109/ICPR.2002.1048026", isbn = "0-7695-1695-5", pages = "662--666", publisher = "{IEEE Computer Society}", title = "{Relationship between Identification Metrics: Expected Confusion and Area Under a ROC Curve}", year = 2002, }