Amos Y. Johnson, Aaron F. Bobick
Relationship between Identification Metrics: Expected Confusion and Area Under a ROC Curve
ICPR, 2002.
@inproceedings{ICPR-v3-2002-JohnsonB,
author = "Amos Y. Johnson and Aaron F. Bobick",
booktitle = "{Proceedings of the 16th International Conference on Pattern Recognition, Volume 3}",
doi = "10.1109/ICPR.2002.1048026",
isbn = "0-7695-1695-5",
pages = "662--666",
publisher = "{IEEE Computer Society}",
title = "{Relationship between Identification Metrics: Expected Confusion and Area Under a ROC Curve}",
year = 2002,
}











