Daniel Toth, Alexandru Condurache, Til Aach
A Two-Stage-Classifier for Defect Classification in Optical Media Inspection
ICPR, 2002.
@inproceedings{ICPR-v4-2002-TothCA, author = "Daniel Toth and Alexandru Condurache and Til Aach", booktitle = "{Proceedings of the 16th International Conference on Pattern Recognition, Volume 4}", doi = "10.1109/ICPR.2002.1047473", isbn = "0-7695-1695-5", pages = "373--376", publisher = "{IEEE Computer Society}", title = "{A Two-Stage-Classifier for Defect Classification in Optical Media Inspection}", year = 2002, }