Travelled to:1 × Canada
1 × United Kingdom
Collaborated with:T.Aach A.Condurache I.Stuke A.Wagner
Talks about:signific (1) classifi (1) inspect (1) cluster (1) classif (1) shadow (1) detect (1) defect (1) stage (1) shift (1)
Person: Daniel Toth
DBLP: Toth:Daniel
Contributed to:
20042002Wrote 2 papers:
- ICPR-v4-2004-TothSWA #clustering #detection #using
- Detection of Moving Shadows using Mean Shift Clustering and a Significance Test (DT, IS, AW, TA), pp. 260–263.
- ICPR-v4-2002-TothCA #classification #fault
- A Two-Stage-Classifier for Defect Classification in Optical Media Inspection (DT, AC, TA), pp. 373–376.