Benoit Baudry, Franck Fleurey, Yves Le Traon
Improving test suites for efficient fault localization
ICSE, 2006.
@inproceedings{ICSE-2006-BaudryFT, author = "Benoit Baudry and Franck Fleurey and Yves Le Traon", booktitle = "{Proceedings of the 28th International Conference on Software Engineering}", doi = "10.1145/1134299", editor = "Leon J. Osterweil and Hans Dieter Rombach and Mary Lou Soffa", isbn = "1-59593-375-1", pages = "82--91", publisher = "{ACM}", title = "{Improving test suites for efficient fault localization}", year = 2006, }