An empirical study of the effects of test-suite reduction on fault localization
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Yanbing Yu, James A. Jones, Mary Jean Harrold
An empirical study of the effects of test-suite reduction on fault localization
ICSE, 2008.

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@inproceedings{ICSE-2008-YuJH,
	author        = "Yanbing Yu and James A. Jones and Mary Jean Harrold",
	booktitle     = "{Proceedings of the 30th International Conference on Software Engineering}",
	doi           = "10.1145/1368088.1368116",
	editor        = "Wilhelm Schäfer and Matthew B. Dwyer and Volker Gruhn",
	isbn          = "978-1-60558-079-1",
	pages         = "201--210",
	publisher     = "{ACM}",
	title         = "{An empirical study of the effects of test-suite reduction on fault localization}",
	year          = 2008,
}

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