Yanbing Yu, James A. Jones, Mary Jean Harrold
An empirical study of the effects of test-suite reduction on fault localization
ICSE, 2008.
@inproceedings{ICSE-2008-YuJH, author = "Yanbing Yu and James A. Jones and Mary Jean Harrold", booktitle = "{Proceedings of the 30th International Conference on Software Engineering}", doi = "10.1145/1368088.1368116", editor = "Wilhelm Schäfer and Matthew B. Dwyer and Volker Gruhn", isbn = "978-1-60558-079-1", pages = "201--210", publisher = "{ACM}", title = "{An empirical study of the effects of test-suite reduction on fault localization}", year = 2008, }