Jaechang Nam, Sinno Jialin Pan, Sunghun Kim
Transfer defect learning
ICSE, 2013.
@inproceedings{ICSE-2013-NamPK, acmid = "2486839", author = "Jaechang Nam and Sinno Jialin Pan and Sunghun Kim", booktitle = "{Proceedings of the 35th International Conference on Software Engineering}", editor = "David Notkin and Betty H. C. Cheng and Klaus Pohl", isbn = "978-1-4673-3076-3", pages = "382--391", publisher = "{IEEE / ACM}", title = "{Transfer defect learning}", year = 2013, }