Travelled to:
1 × Hungary
1 × Italy
1 × USA
Collaborated with:
S.Kim S.J.Pan S.W.0009 L.T.0001 D.Kim J.Song M.Kim J.Yeon S.Choi T.Lee D.Han H.P.In
Talks about:
defect (5) predict (4) patch (2) learn (2) test (2) heterogen (1) transfer (1) interact (1) written (1) unlabel (1)
Person: Jaechang Nam
DBLP: Nam:Jaechang
Contributed to:
Wrote 7 papers:
- ESEC-FSE-2015-KimNYCK #api #fault #named #performance #predict #testing
- REMI: defect prediction for efficient API testing (MK, JN, JY, SC, SK), pp. 990–993.
- ESEC-FSE-2015-NamK #fault #predict
- Heterogeneous defect prediction (JN, SK), pp. 508–519.
- ICSE-2013-KimNSK #automation #generative
- Automatic patch generation learned from human-written patches (DK, JN, JS, SK), pp. 802–811.
- ICSE-2013-NamPK #fault #learning
- Transfer defect learning (JN, SJP, SK), pp. 382–391.
- ESEC-FSE-2011-LeeNHKI #fault #interactive #metric #predict
- Micro interaction metrics for defect prediction (TL, JN, DH, SK, HPI), pp. 311–321.
- ASE-2015-NamK #dataset #fault #named #predict
- CLAMI: Defect Prediction on Unlabeled Datasets (T) (JN, SK), pp. 452–463.
- ESEC-FSE-2017-WangNT #named #testing
- QTEP: quality-aware test case prioritization (SW0, JN, LT0), pp. 523–534.