Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit Baudry, Yves Le Traon
Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
ICST, 2010.
@inproceedings{ICST-2010-PerrouinSKBT,
author = "Gilles Perrouin and Sagar Sen and Jacques Klein and Benoit Baudry and Yves Le Traon",
booktitle = "{Proceedings of the Third International Conference on Software Testing, Verification and Validation}",
doi = "10.1109/ICST.2010.43",
isbn = "978-0-7695-3990-4",
pages = "459--468",
publisher = "{IEEE Computer Society}",
title = "{Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines}",
year = 2010,
}











