Tony Fountain, Thomas G. Dietterich, Bill Sudyka
Mining IC test data to optimize VLSI testing
KDD, 2000.
@inproceedings{KDD-2000-FountainDS, author = "Tony Fountain and Thomas G. Dietterich and Bill Sudyka", booktitle = "{Proceedings of the Sixth International Conference on Knowledge Discovery and Data Mining}", doi = "10.1145/347090.347099", isbn = "1-58113-233-6", pages = "18--25", publisher = "{ACM}", title = "{Mining IC test data to optimize VLSI testing}", year = 2000, }