Mining IC test data to optimize VLSI testing
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Tony Fountain, Thomas G. Dietterich, Bill Sudyka
Mining IC test data to optimize VLSI testing
KDD, 2000.

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@inproceedings{KDD-2000-FountainDS,
	author        = "Tony Fountain and Thomas G. Dietterich and Bill Sudyka",
	booktitle     = "{Proceedings of the Sixth International Conference on Knowledge Discovery and Data Mining}",
	doi           = "10.1145/347090.347099",
	isbn          = "1-58113-233-6",
	pages         = "18--25",
	publisher     = "{ACM}",
	title         = "{Mining IC test data to optimize VLSI testing}",
	year          = 2000,
}

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