A detectability analysis of fault classes for Boolean specifications
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Zhenyu Chen, Baowen Xu, Changhai Nie
A detectability analysis of fault classes for Boolean specifications
SAC, 2008.

SAC 2008
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@inproceedings{SAC-2008-ChenXN,
	author        = "Zhenyu Chen and Baowen Xu and Changhai Nie",
	booktitle     = "{Proceedings of the 23rd Symposium on Applied Computing}",
	doi           = "10.1145/1363686.1363874",
	editor        = "Roger L. Wainwright and Hisham Haddad",
	isbn          = "978-1-59593-753-7",
	pages         = "826--830",
	publisher     = "{ACM}",
	title         = "{A detectability analysis of fault classes for Boolean specifications}",
	year          = 2008,
}

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